Patents:

Renuka P. Jindal and Saurabh Sirohi, “A method to reduce excess high-frequency noise in MOSFETs" UL Lafayette IP disclosure filed (11-15-2005).

US Patent Number 6,184,692 ( 02-06-2001 ), “ Loop back test apparatus and technique” by R. P. Jindal

US Patent Number 5,821,758 ( 10-13-1998 ), “Techniques for non-invasive RF circuit testing and RF signal flow redirection” by R. P. Jindal

US Patent Number 5,239.193 ( 08-24-1993 ), “Silicon photodiode for monolithic integrated circuits”, by Janet L. Benton, R. P.  Jindal and Ya-Hong Xie

US Patent Number 5,141,878 ( 08-25-1992 ), “Silicon photodiode for monolithic integrated circuits and method for making same” by Janet L. Benton, R. P.  Jindal and Ya-Hong Xie